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Author
Date
2012Type
- Doctoral Thesis
ETH Bibliography
yes
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https://doi.org/10.3929/ethz-a-007578086Publication status
publishedExternal links
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Publisher
ETH / EMPASubject
SCANNING MICROSCOPES + SCANNING MICROSCOPY; OPTISCHE NAHFELDMIKROSKOPIE (OPTIK); RASTERMIKROSKOPE + RASTERMIKROSKOPIE; NANOSTRUKTURIERTE MATERIALIEN (PHYSIK DER KONDENSIERTEN MATERIE); NANOSTRUCTURED MATERIALS (CONDENSED MATTER PHYSICS); NEAR-FIELD OPTICAL MICROSCOPY (OPTICS); MEASURING DEVICES, SENSORS, DETECTORS (PHYSICS); MESSTECHNISCHE SONDEN, SENSOREN, DETEKTOREN (PHYSIK)Organisational unit
02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.01214 - DR Inf.technologie und Elektrotechnik / DR Information Tech.+ Electrical Engin.
03848 - Bona, Gian-Luca (emeritus) / Bona, Gian-Luca (emeritus)
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ETH Bibliography
yes
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