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Author
Date
2012Type
- Doctoral Thesis
ETH Bibliography
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Permanent link
https://doi.org/10.3929/ethz-a-007326114Publication status
publishedExternal links
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Publisher
ETHSubject
SCANNING MICROSCOPES + SCANNING MICROSCOPY; OPTISCHE NAHFELDMIKROSKOPIE (OPTIK); RASTERMIKROSKOPE + RASTERMIKROSKOPIE; NUMERISCHE SIMULATION UND MATHEMATISCHE MODELLRECHNUNG; NUMERICAL SIMULATION AND MATHEMATICAL MODELING; MIKROWELLENTECHNIK (ELEKTROTECHNIK); ELECTROMAGNETIC FIELDS, MAGNETIC FIELD OF CURRENTS; MICROWAVE ENGINEERING (ELECTRICAL ENGINEERING); FINITE-ELEMENTE-METHODE (NUMERISCHE MATHEMATIK); FINITE ELEMENT METHOD (NUMERICAL MATHEMATICS); NEAR-FIELD OPTICAL MICROSCOPY (OPTICS); ELEKTROMAGNETISCHES FELD, MAGNETISCHES FELD VON STRÖMENOrganisational unit
02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.03472 - Professur für Feldtheorie (ehemalig)
03202 - Fröhlich, Jürg
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ETH Bibliography
yes
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