Techniques to quantify local electric potentials and eliminate electrostatic artifacts in atomic force microscopy
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Author
Date
2009Type
- Doctoral Thesis
ETH Bibliography
yes
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Permanent link
https://doi.org/10.3929/ethz-a-005836152Publication status
publishedExternal links
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Publisher
ETHSubject
NANOTECHNOLOGY; MICROTECHNOLOGY; NANOTECHNOLOGIE; ELEKTROSTATIK/TECHNISCHE ANWENDUNG (ELEKTROTECHNIK); SCANNING ELECTRON MICROSCOPES, SEM + SCANNING ELECTRON MICROSCOPY; ELECTROSTATICS/TECHNICAL APPLICATIONS (ELECTRICAL ENGINEERING); MIKROTECHNIK; RASTERELEKTRONENMIKROSKOPE, REM + RASTERELEKTRONENMIKROSKOPIEOrganisational unit
03444 - Stemmer, Andreas / Stemmer, Andreas
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ETH Bibliography
yes
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