Structural characterisations of sputtered metallic multilayers
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Author
Date
1998Type
- Doctoral Thesis
ETH Bibliography
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https://doi.org/10.3929/ethz-a-001963960Publication status
publishedExternal links
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Publisher
ETH ZürichSubject
MULTISCHICHTEN (PHYSIK VON MOLEKULARSYSTEMEN); METALLISCHE WERKSTOFFE; EIGENSCHAFTEN UND STRUKTUR DURCH RÖNTGENSTRAHLEN ERWIESEN (PHYSIK VON MOLEKULARSYSTEMEN); NEUTRONENBEUGUNG IN DER STRUKTURUNTERSUCHUNG (PHYSIK VON MOLEKULARSYSTEMEN); IONENSPUTTERING (ELEKTRODYNAMIK); ERZEUGUNG DÜNNER SCHICHTEN (PHYSIK VON MOLEKULARSYSTEMEN); NANOSTRUKTUR (PHYSIK DER KONDENSIERTEN MATERIE); MULTILAYERS (PHYSICS OF MOLECULAR SYSTEMS); METALLIC MATERIALS; CHARACTERISTICS AND STRUCTURE REVEALED BY X-RAYS (PHYSICS OF MOLECULAR SYSTEMS); STRUCTURE ANALYSIS BY NEUTRON DIFFRACTION (PHYSICS OF MOLECULAR SYSTEMS); ION SPUTTERING (ELECTRODYNAMICS); PRODUCTION OF THIN FILMS (PHYSICS OF MOLECULAR SYSTEMS); NANOSTRUCTURE (CONDENSED MATTER PHYSICS)Organisational unit
08727 - Furrer, Albert (Tit.-Prof.)
Notes
Diss. Naturwiss. ETH Zürich, Nr. 12692, 1998. Ref.: A. Furrer ; Korref.: G. Kostorz ; Korref.: P. Buffat.More
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ETH Bibliography
yes
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