Active pixel image sensors with application specific performance based on standard silicon CMOS processes
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Author
Date
1997Type
- Doctoral Thesis
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https://doi.org/10.3929/ethz-a-001738618Publication status
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ETH ZürichSubject
KOMPLEMENTÄRE METALLOXID-HALBLEITERSCHALTUNGEN, CMOS (MIKROELEKTRONIK); ELEKTRONISCHE BILDVERARBEITUNG; PHOTODIODEN (OPTOELEKTRONIK); LADUNGSGEKOPPELTE BAUELEMENTE, CCD (ELEKTRONIK); COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR CIRCUITS, CMOS (MICROELECTRONICS); ELECTRONIC IMAGE PROCESSING; PHOTODIODES (OPTOELECTRONICS); CHARGE-COUPLED DEVICES, CCD (ELECTRONICS)Notes
Diss. Techn. Wiss. ETH Zürich, Nr. 12038, 1997. Ref.: H. Jäckel ; Korref.: P. Seitz.More
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