Scanning tunneling microscopy and anatomic force microscopy studies of epitaxial Si₁₋xGex films
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Author
Date
1994Type
- Doctoral Thesis
ETH Bibliography
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https://doi.org/10.3929/ethz-a-001369246Publication status
publishedExternal links
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ETH ZürichSubject
RASTERTUNNELMIKROSKOPE, RTM + RASTERTUNNELMIKROSKOPIE; RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE; EPITAXIALSCHICHTEN (PHYSIK VON MOLEKULARSYSTEMEN); SCANNING TUNNELING MICROSCOPES, STM + SCANNING TUNNELING MICROSCOPY; ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; THIN LAYER FORMATION BY VAPORIZATION AND CONDENSATION (PHYSICS OF MOLECULAR SYSTEMS)Notes
Diss. Naturwiss. ETH Zürich, Nr. 10905, 1994. Ref.: H.-C. Siegmann ; Korref.: H. von Känel ; Korref.: R. M. Feenstra.More
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ETH Bibliography
yes
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