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Author
Date
2008Type
- Doctoral Thesis
ETH Bibliography
yes
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Permanent link
https://doi.org/10.3929/ethz-a-005593991Publication status
publishedExternal links
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Publisher
ETHSubject
RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE; NMR-MIKROSKOPIE, NMR-ABBILDUNDSVERFAHREN; NMR-MIKROSKOPIE, NMR-ABBILDUNDSVERFAHREN; ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; NMR MICROSCOPY, NMR IMAGING; NMR MICROSCOPY, NMR IMAGINGOrganisational unit
03496 - Meier, Beat H. (emeritus) / Meier, Beat H. (emeritus)
Notes
Diss., Eidgenössische Technische Hochschule ETH Zürich, Nr. 17562, 2008.More
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ETH Bibliography
yes
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