Nanometer-scale CMOS circuits and packaging for electro-optical high density interconnects up to 40 Gb/s
Open access
Author
Date
2008Type
- Doctoral Thesis
ETH Bibliography
yes
Altmetrics
Permanent link
https://doi.org/10.3929/ethz-a-005565086Publication status
publishedExternal links
Search print copy at ETH Library
Publisher
ETHSubject
KOMPLEMENTÄRE METALLOXID-HALBLEITERSCHALTUNGEN, CMOS (MIKROELEKTRONIK); NANOELEKTRONIK; COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR CIRCUITS, CMOS (MICROELECTRONICS); NANOELECTRONICSOrganisational unit
03386 - Jäckel, Heinz
Notes
Diss., Eidgenössische Technische Hochschule ETH Zürich, Nr. 17647, 2008.More
Show all metadata
ETH Bibliography
yes
Altmetrics