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Author
Date
2004Type
- Doctoral Thesis
ETH Bibliography
yes
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https://doi.org/10.3929/ethz-a-004726149Publication status
publishedExternal links
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Publisher
ETHSubject
ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; THEORIE DER REGELUNGSTECHNIK + THEORIE DER STEUERUNGSTECHNIK (ELEKTROTECHNIK); CONTROL ENGINEERING THEORY (ELECTRICAL ENGINEERING); MEASURING DEVICES, SENSORS, DETECTORS (PHYSICS); MESSTECHNISCHE SONDEN, SENSOREN, DETEKTOREN (PHYSIK); RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIEOrganisational unit
03444 - Stemmer, Andreas / Stemmer, Andreas
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ETH Bibliography
yes
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