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Author
Date
2000Type
- Doctoral Thesis
ETH Bibliography
yes
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Permanent link
https://doi.org/10.3929/ethz-a-003877763Publication status
publishedExternal links
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Publisher
ETH ZürichSubject
NANOSTRUKTUR (PHYSIK DER KONDENSIERTEN MATERIE); PUNKTDEFEKTE UND VERUNREINIGUNGEN (KRISTALLOGRAPHIE); RASTERSONDENMIKROSKOPE, RSM + RASTERSONDENMIKROSKOPIE; NANOSTRUCTURE (CONDENSED MATTER PHYSICS); POINT DEFECTS AND IMPURITIES (CRYSTALLOGRAPHY); SCANNING PROBE MICROSCOPES, SPM + SCANNING PROBE MICROSCOPYOrganisational unit
03118 - Wachter, Peter
Notes
Diss. Naturwissenschaften ETH Zürich, Nr. 13412, 2000.More
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ETH Bibliography
yes
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