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| Metadata Label | Value |
|---|---|
| Author(s): | Nyilas, Ralph Derek |
| Publisher: | ETH |
| Citation: | Nyilas, Ralph Derek. An investigation on scale effects in the mechanics of materials from the atomistic to the mesoscopic scale. synchrotron x-ray microdiffraction to reveal mesoscopic plastic deformation mechanisms in polycristalline thin films a micropolar continuum theory of polycristalline deformation by Ralph Derek Nyilas. ETH (2009). http://dx.doi.org/10.3929/ethz-a-005966790 |
| Document Type: | Doctoral and Habilitation Theses |
| Documents: |
Abstract
(168.09KB),
Fulltext
(28.84MB) |
| Metadata | Description |
|---|---|
| Title | An investigation on scale effects in the mechanics of materials from the atomistic to the mesoscopic scale |
| Subtitle | synchrotron x-ray microdiffraction to reveal mesoscopic plastic deformation mechanisms in polycristalline thin films a micropolar continuum theory of polycristalline deformation by Ralph Derek Nyilas |
| Author(s) | Nyilas, Ralph Derek |
| Publication Place | Zürich |
| Publisher | ETH |
| Publication Date | 2009 |
| Notes | Diss., Eidgenössische Technische Hochschule ETH Zürich, Nr. 18610, 2009 |
| Language | English |
| DOI | http://dx.doi.org/10.3929/ethz-a-005966790 |
| Subject(s) |
Microelectronics, Integrated Circuits Metallurgy |
| Keyword(s) |
MICROELECTRONIC DEVICES HOMOGENEOUS CRYSTALLINE AGGREGATES MICROSTRUCTURE OF MOLECULAR SYSTEMS PHYSICS RELATIONSHIPS BETWEEN INTERNAL STRESSES AND IRREGULARITIES CRACKS PHYSICS OF MOLECULAR SYSTEMS METAL PLATES METAL SHEETS METAL FILMS METAL PRODUCTS PROPERTIES OF THIN LAYERS CHEMICAL ELEMENTS |
| Description | File Name | MIME Type | Size |
|---|---|---|---|
| Abstract |
eth-658-01.pdf |
application/pdf | 168.09KB |
| Fulltext |
eth-658-02.pdf |
application/pdf | 28.84MB |
| Description | URL |
|---|---|
| NEBIS Link | http://opac.nebis.ch/F/?local_base=NEBIS&func=find-b&find_code=SYS&request=005966790 |
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E-Collection record created: Sat, 30 Jan 2010, 05:31:09 CET