Dynamische Rasterkraftmikroskopie: Bewegungsanalyse des Kraftsensors

Metadata Label Value
Author(s): Hämmerle, Stefan
Publisher: Unknown
Citation:

Hämmerle, Stefan. Dynamische Rasterkraftmikroskopie: Bewegungsanalyse des Kraftsensors. (1997). http://dx.doi.org/10.3929/ethz-a-001843516

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (200.51KB)
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Detailed Information

Metadata Description
Title Dynamische Rasterkraftmikroskopie: Bewegungsanalyse des Kraftsensors
Author(s) Hämmerle, Stefan
Publication Place Zürich
Publication Date 1997
Notes Diss. Techn. Wiss. ETH Zürich, Nr. 12290, 1997. Ref.: P. Niederer ; Korref.: A. Stemmer
Language German
DOI http://dx.doi.org/10.3929/ethz-a-001843516
Subject(s) Electrical Engineering, General
Physics, General
Kondensierte Materie
Keyword(s) ATOMIC FORCE MICROSCOPES
AFM
Description File Name MIME Type Size
Abstract   eth-40852-01.pdf application/pdf 200.51KB
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E-Collection record created: Wed, 18 Feb 2009, 16:14:45 CET