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Dynamische Rasterkraftmikroskopie: Bewegungsanalyse des Kraftsensors
| Metadata Label | Value |
|---|---|
| Author(s): | Hämmerle, Stefan |
| Publisher: | Unknown |
| Citation: | Hämmerle, Stefan. Dynamische Rasterkraftmikroskopie: Bewegungsanalyse des Kraftsensors. (1997). http://dx.doi.org/10.3929/ethz-a-001843516 |
| Document Type: | Doctoral and Habilitation Theses |
| Documents: |
Abstract
(200.51KB) |
Detailed Information
| Metadata | Description |
|---|---|
| Title | Dynamische Rasterkraftmikroskopie: Bewegungsanalyse des Kraftsensors |
| Author(s) | Hämmerle, Stefan |
| Publication Place | Zürich |
| Publication Date | 1997 |
| Notes | Diss. Techn. Wiss. ETH Zürich, Nr. 12290, 1997. Ref.: P. Niederer ; Korref.: A. Stemmer |
| Language | German |
| DOI | http://dx.doi.org/10.3929/ethz-a-001843516 |
| Subject(s) |
Electrical Engineering, General Physics, General Kondensierte Materie |
| Keyword(s) |
ATOMIC FORCE MICROSCOPES AFM |
| Description | File Name | MIME Type | Size |
|---|---|---|---|
| Abstract |
eth-40852-01.pdf |
application/pdf | 200.51KB |
| Description | URL |
|---|---|
| NEBIS Link | http://opac.nebis.ch/F/?local_base=NEBIS&func=find-b&find_code=SYS&request=001843516 |
Abstract Views and Downloads  |
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| Views | 38 |  |
| Downloads | 35 |  |
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| Downloads | 5 | |
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| Downloads | 3 | |
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Views | 6 | |
| Downloads | 3 | |
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E-Collection record created: Wed, 18 Feb 2009, 16:14:45 CET