Analyse von Spurenelementen mit Beschleuniger-Sekundärionen-Massenspektrometrie

Metadata Label Value
Author(s): Ender, Rainer Markus
Publisher: Unknown
Citation:

Ender, Rainer Markus. Analyse von Spurenelementen mit Beschleuniger-Sekundärionen-Massenspektrometrie. (1997). http://dx.doi.org/10.3929/ethz-a-001793727

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (226.04KB)

Detailed Information

Metadata Description
Title Analyse von Spurenelementen mit Beschleuniger-Sekundärionen-Massenspektrometrie
Author(s) Ender, Rainer Markus
Publication Place Zürich
Publication Date 1997
Notes Diss. Naturwiss. ETH Zürich, Nr. 12213, 1997. Ref.: J. Lang ; Korref.: E. Nolte ; Korref.: M. Suter
Language German
DOI http://dx.doi.org/10.3929/ethz-a-001793727
Subject(s) Analytical Chemistry
Spectroscopy
Keyword(s) SECONDARY IONS MASS SPECTROMETRY
TRACE ELEMENTS
CHEMISTRY
ELECTRON-BEAM SPUTTERING
ELECTRODYNAMICS
Description File Name MIME Type Size
Abstract   eth-40734-01.pdf application/pdf 226.04KB
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E-Collection record created: Wed, 18 Feb 2009, 16:04:49 CET