Transmission electron microscopy of Fe-Si and Si film on Si substrates

Metadata Label Value
Author(s): Deller, Hans Rudolf
Publisher: Unknown
Citation:

Deller, Hans Rudolf. Transmission electron microscopy of Fe-Si and Si film on Si substrates. (1997). http://dx.doi.org/10.3929/ethz-a-001793648

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (198.70KB) , Fulltext (11.10MB)
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Detailed Information

Metadata Description
Title Transmission electron microscopy of Fe-Si and Si film on Si substrates
Author(s) Deller, Hans Rudolf
Publication Place Zürich
Publication Date 1997
Notes Diss. Naturwiss. ETH Zürich, Nr. 12193, 1997. Ref.: H.-U. Nissen ; Korref.: H. von Känel ; Korref.: K. Ensslin
DOI http://dx.doi.org/10.3929/ethz-a-001793648
Subject(s) Electrodynamics, Optics, Laser
Condensed Matter
Keyword(s) SURFACE CRYSTALLOGRAPHY
TRANSMISSION ELECTRON MICROSCOPES
TEM
TRANSMISSION ELECTRON MICROSCOPY
MEASUREMENT METHODS
TECHNIQUES FOR SURFACES
PHYSICS OF MOLECULAR SYSTEMS
PRODUCTION OF THIN FILMS
METAL SILICIDES
INORGANIC CHEMISTRY
SILICON
CHEMICAL ELEMENTS
Description File Name MIME Type Size
Abstract   eth-40730-01.pdf application/pdf 198.70KB
Fulltext   eth-40730-02.pdf application/pdf 11.10MB
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E-Collection record created: Wed, 18 Feb 2009, 16:04:28 CET