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Transmission electron microscopy of Fe-Si and Si film on Si substrates
| Metadata Label | Value |
|---|---|
| Author(s): | Deller, Hans Rudolf |
| Publisher: | Unknown |
| Citation: | Deller, Hans Rudolf. Transmission electron microscopy of Fe-Si and Si film on Si substrates. (1997). http://dx.doi.org/10.3929/ethz-a-001793648 |
| Document Type: | Doctoral and Habilitation Theses |
| Documents: |
Abstract
(198.70KB),
Fulltext
(11.10MB) |
Detailed Information
| Metadata | Description |
|---|---|
| Title | Transmission electron microscopy of Fe-Si and Si film on Si substrates |
| Author(s) | Deller, Hans Rudolf |
| Publication Place | Zürich |
| Publication Date | 1997 |
| Notes | Diss. Naturwiss. ETH Zürich, Nr. 12193, 1997. Ref.: H.-U. Nissen ; Korref.: H. von Känel ; Korref.: K. Ensslin |
| DOI | http://dx.doi.org/10.3929/ethz-a-001793648 |
| Subject(s) |
Electrodynamics, Optics, Laser Condensed Matter |
| Keyword(s) |
SURFACE CRYSTALLOGRAPHY TRANSMISSION ELECTRON MICROSCOPES TEM TRANSMISSION ELECTRON MICROSCOPY MEASUREMENT METHODS TECHNIQUES FOR SURFACES PHYSICS OF MOLECULAR SYSTEMS PRODUCTION OF THIN FILMS METAL SILICIDES INORGANIC CHEMISTRY SILICON CHEMICAL ELEMENTS |
| Description | File Name | MIME Type | Size |
|---|---|---|---|
| Abstract |
eth-40730-01.pdf |
application/pdf | 198.70KB |
| Fulltext |
eth-40730-02.pdf |
application/pdf | 11.10MB |
| Description | URL |
|---|---|
| NEBIS Link | http://opac.nebis.ch/F/?local_base=NEBIS&func=find-b&find_code=SYS&request=001793648 |
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E-Collection record created: Wed, 18 Feb 2009, 16:04:28 CET