Ballistic-electron-emission microscopy on epitaxial CoSi₂ / Si interfaces

Metadata Label Value
Author(s): Sirringhaus, Henning
Publisher: Unknown
Citation:

Sirringhaus, Henning. Ballistic-electron-emission microscopy on epitaxial CoSi₂ / Si interfaces. (1995). http://dx.doi.org/10.3929/ethz-a-001486644

Document Type: Doctoral and Habilitation Theses  

Detailed Information

Metadata Description
Title Ballistic-electron-emission microscopy on epitaxial CoSi₂ / Si interfaces
Author(s) Sirringhaus, Henning
Publication Place Zürich
Publication Date 1995
Notes Diss. Naturwiss. ETH Zürich, Nr. 11173, 1995. Ref.: P. Wachter ; Korref.: Ø. Fischer ; Korref.: H. von Känel
Language English
DOI http://dx.doi.org/10.3929/ethz-a-001486644
Subject(s) Physical Chemistry and Electrochemistry
Keyword(s) SILICON CRYSTALS
INORGANIC CHEMISTRY
THIN LAYER FORMATION BY VAPORIZATION AND CONDENSATION
PHYSICS OF MOLECULAR SYSTEMS
HOT-CARRIER EFFECT
CONDENSED-MATTER PHYSICS
SCANNING TUNNELING MICROSCOPES
STM
SCANNING TUNNELING MICROSCOPY
COBALT-SILICON COMPOUNDS
BALLISTIC ELECTRON EMISSION MICROSCOPES
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E-Collection record created: Wed, 18 Feb 2009, 14:55:14 CET