Halbleitereigenschaften von Passivfilmen

Metadata Label Value
Author(s): Schmuki, Patrik
Publisher: Unknown
Citation:

Schmuki, Patrik. Halbleitereigenschaften von Passivfilmen. photoelektrochemische Untersuchungen und Mott-Schottky Analyse an Passivfilmen hochlegierter Stähle von Patrik Schmuki. (1992). http://dx.doi.org/10.3929/ethz-a-000642217

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (212.92KB)

Detailed Information

Metadata Description
Title Halbleitereigenschaften von Passivfilmen
Subtitle photoelektrochemische Untersuchungen und Mott-Schottky Analyse an Passivfilmen hochlegierter Stähle von Patrik Schmuki
Abstract/Summary Engl. Zusammenfass.
Author(s) Schmuki, Patrik
Publication Place Zürich
Publication Date 1992
Notes Diss. Techn. Wiss. ETH Zürich, Nr. 9763, 1992. Ref.: H. Böhni ; Korref.: H. von Känel
Language German
DOI http://dx.doi.org/10.3929/ethz-a-000642217
Subject(s) Semiconductor Technology
Metallurgy
Keyword(s) PHOTOELECTROCHEMISTRY
OXIDE LAYERS
METALLURGY
CONDUCTIVITY OF SEMICONDUCTORS
ELECTRODYNAMICS
IRON
IRON-CARBON ALLOYS
IRON METALLURGY
Description File Name MIME Type Size
Abstract   eth-38593-01.pdf application/pdf 212.92KB
Abstract Views and Downloads
Views 52  abstracts
Downloads 158  downloads

Abstract Views and Downloads by Country
Germany Views 14  abstracts
Downloads 106  downloads
Views 14  abstracts
Downloads 18  downloads
United States Views abstracts
Downloads 11  downloads
Switzerland Views 14  abstracts
Downloads 10  downloads
Austria Views abstracts
Downloads downloads
Japan Views abstracts
Downloads downloads
United Kingdom Views abstracts
Downloads downloads
Romania Views abstracts
Downloads downloads
Russian Federation Views abstracts
Downloads downloads
Slovenia Views abstracts
Downloads downloads
Sweden Views abstracts
Downloads downloads
China Views abstracts
Downloads downloads
Israel Views abstracts
Downloads downloads
Italy Views abstracts
Downloads downloads
Taiwan Views abstracts
Downloads downloads


E-Collection record created: Wed, 18 Feb 2009, 13:09:43 CET