Untersuchungen zur Optimierung von Schutzstrukturen gegen elektrostatische Entladungen in integrierten CMOS-Schaltungen

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Author(s): Abderhalden, Jürg
Publisher: Unknown
Citation:

Abderhalden, Jürg. Untersuchungen zur Optimierung von Schutzstrukturen gegen elektrostatische Entladungen in integrierten CMOS-Schaltungen. (1990). http://dx.doi.org/10.3929/ethz-a-000578586

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (115.52KB)
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Metadata Description
Title Untersuchungen zur Optimierung von Schutzstrukturen gegen elektrostatische Entladungen in integrierten CMOS-Schaltungen
Author(s) Abderhalden, Jürg
Publication Place Zürich
Publication Date 1990
Notes Diss. Naturwiss. ETH Zürich, Nr. 9251, 1990. Ref.: H. Melchior ; Korref.: W. Guggenbühl
Language German
DOI http://dx.doi.org/10.3929/ethz-a-000578586
Subject(s) Microelectronics, Integrated Circuits
Keyword(s) COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR CIRCUITS
MICROELECTRONICS
STATIC CHARGE AND DISCHARGE
ELECTROSTATICS
Description File Name MIME Type Size
Abstract   eth-38036-01.pdf application/pdf 115.52KB
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E-Collection record created: Wed, 18 Feb 2009, 12:24:49 CET