Schichtadmittanzmessung mit Mikrowellen

Metadata Label Value
Author(s): Lamoth, Istvan
Publisher: Unknown
Citation:

Lamoth, Istvan. Schichtadmittanzmessung mit Mikrowellen. (1987). http://dx.doi.org/10.3929/ethz-a-000471021

Documents: Abstract (195.05KB)
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Detailed Information

Metadata Description
Title Schichtadmittanzmessung mit Mikrowellen
Author(s) Lamoth, Istvan
Publication Place Zürich
Publication Date 1987
Notes Diss. Techn. Wiss. ETH Zürich, Nr. 8324, 1987. Ref.: G. Epprecht ; Korref.: H. Baggenstos
Language German
DOI http://dx.doi.org/10.3929/ethz-a-000471021
Subject(s) Electrical Engineering, General
Keyword(s) MICROWAVES
30 MHZ TO 3 THZ
ELECTRICAL ENGINEERING
MEASUREMENT METHODS
SEMICONDUCTORS
SEMICONDUCTOR TECHNOLOGY
PRODUCTION OF THIN FILMS
PHYSICS OF MOLECULAR SYSTEMS
Description File Name MIME Type Size
Abstract   eth-37332-01.pdf application/pdf 195.05KB
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E-Collection record created: Wed, 18 Feb 2009, 11:30:54 CET