Analytische Berechnung und Messung der Potential- und Dichteverteilung in Silizium-Dreischichtdioden von niederen bis zu höchsten Stromdichten

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Author(s): Weiler, Jean, Weiler, Jean, Weiler, Jean
Publisher: Juris
Citation:

Weiler, Jean, Weiler, Jean and Weiler, Jean. Analytische Berechnung und Messung der Potential- und Dichteverteilung in Silizium-Dreischichtdioden von niederen bis zu höchsten Stromdichten. Juris (1967). http://dx.doi.org/10.3929/ethz-a-000093377

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (111.78KB)

Detailed Information

Metadata Description
Title Analytische Berechnung und Messung der Potential- und Dichteverteilung in Silizium-Dreischichtdioden von niederen bis zu höchsten Stromdichten
Author(s) Weiler, Jean
Weiler, Jean
Weiler, Jean
Publication Place Zürich
Publisher Juris
Publication Date 1967
Notes Diss. Techn.Wiss. ETH Zürich, Nr. 4021, 1968. Ref.: Gerecke, E. ; Korref.: Guggenbühl, W.
Language German
DOI http://dx.doi.org/10.3929/ethz-a-000093377
Subject(s) Electronics, Power Electronics and Mechatronics
Keyword(s) JUNCTION DIODES WITH MULTIPLE PN JUNCTION
Description File Name MIME Type Size
Abstract   eth-33277-01.pdf application/pdf 111.78KB
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E-Collection record created: Wed, 18 Feb 2009, 06:20:21 CET