Beiträge zur Ermittlung der Felder in stromdurchflossenen Halbleiterplatten unter dem Einfluss eines transversalen, statischen Magnetfeldes

Metadata Label Value
Author(s): Burckhardt, Christoph Benedikt
Publisher: Unknown
Citation:

Burckhardt, Christoph Benedikt. Beiträge zur Ermittlung der Felder in stromdurchflossenen Halbleiterplatten unter dem Einfluss eines transversalen, statischen Magnetfeldes. (1963). http://dx.doi.org/10.3929/ethz-a-000087794

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (105.75KB)

Detailed Information

Metadata Description
Title Beiträge zur Ermittlung der Felder in stromdurchflossenen Halbleiterplatten unter dem Einfluss eines transversalen, statischen Magnetfeldes
Author(s) Burckhardt, Christoph Benedikt
Publication Place Zürich
Publication Date 1963
Notes Diss. Techn.Wiss. ETH Zürich, Nr. 3374, 0000. Ref.: Strutt, M. ; Korref.: Borgnis, F.
Language German
DOI http://dx.doi.org/10.3929/ethz-a-000087794
Subject(s) Electronics, Power Electronics and Mechatronics
Keyword(s) SEMICONDUCTORS
CONDUCTIVITY OF SEMICONDUCTORS
Description File Name MIME Type Size
Abstract   eth-31845-01.pdf application/pdf 105.75KB
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E-Collection record created: Wed, 18 Feb 2009, 04:44:59 CET