Mesure sous vide des états de surface d'un semiconducteur par la méthode des pertes de la capacité M.I.S

Metadata Label Value
Author(s): Juillerat, Raymond
Publisher: Unknown
Citation:

Juillerat, Raymond. Mesure sous vide des états de surface d'un semiconducteur par la méthode des pertes de la capacité M.I.S. (1974). http://dx.doi.org/10.3929/ethz-a-000085311

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (98.66KB)

Detailed Information

Metadata Description
Title Mesure sous vide des états de surface d'un semiconducteur par la méthode des pertes de la capacité M.I.S
Author(s) Juillerat, Raymond
Publication Place Zürich
Publication Date 1974
Notes Diss. Techn.Wiss. ETH Zürich, Nr. 5261, 0000. Ref.: Strutt, M.J.O. ; Korref.: Wachter, P.
Language French
DOI http://dx.doi.org/10.3929/ethz-a-000085311
Subject(s) Semiconductor Technology
Keyword(s) SEMICONDUCTORS
Description File Name MIME Type Size
Abstract   eth-31321-01.pdf application/pdf 98.66KB
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E-Collection record created: Wed, 18 Feb 2009, 04:11:59 CET