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| Metadata Label | Value |
|---|---|
| Author(s): | Juillerat, Raymond |
| Publisher: | Unknown |
| Citation: | Juillerat, Raymond. Mesure sous vide des états de surface d'un semiconducteur par la méthode des pertes de la capacité M.I.S. (1974). http://dx.doi.org/10.3929/ethz-a-000085311 |
| Document Type: | Doctoral and Habilitation Theses |
| Documents: |
Abstract
(98.66KB) |
| Metadata | Description |
|---|---|
| Title | Mesure sous vide des états de surface d'un semiconducteur par la méthode des pertes de la capacité M.I.S |
| Author(s) | Juillerat, Raymond |
| Publication Place | Zürich |
| Publication Date | 1974 |
| Notes | Diss. Techn.Wiss. ETH Zürich, Nr. 5261, 0000. Ref.: Strutt, M.J.O. ; Korref.: Wachter, P. |
| Language | French |
| DOI | http://dx.doi.org/10.3929/ethz-a-000085311 |
| Subject(s) | Semiconductor Technology |
| Keyword(s) | SEMICONDUCTORS |
| Description | File Name | MIME Type | Size |
|---|---|---|---|
| Abstract |
eth-31321-01.pdf |
application/pdf | 98.66KB |
| Description | URL |
|---|---|
| NEBIS Link | http://opac.nebis.ch/F/?local_base=NEBIS&func=find-b&find_code=SYS&request=000085311 |
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E-Collection record created: Wed, 18 Feb 2009, 04:11:59 CET