Neural interface and atomic-force microscope in CMOS technology

Metadata Label Value
Author(s): Hafizović, Sadik
Publisher: Physical Electronics Laboratory, ETH Zürich
Citation:

Hafizović, Sadik. Neural interface and atomic-force microscope in CMOS technology. Physical Electronics Laboratory, ETH Zürich (2006). http://dx.doi.org/10.3929/ethz-a-005352865

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (227.55KB) , Fulltext (6.28MB)
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Detailed Information

Metadata Description
Title Neural interface and atomic-force microscope in CMOS technology
Author(s) Hafizović, Sadik
Publication Place Zürich
Publisher Physical Electronics Laboratory, ETH Zürich
Publication Date 2006
Notes Diss., Eidgenössische Technische Hochschule ETH Zürich, Nr. 16806, 2006
Language English
DOI http://dx.doi.org/10.3929/ethz-a-005352865
Subject(s) Microelectronics, Integrated Circuits
Keyword(s) COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR CIRCUITS
MICROELECTRONICS
MICRO SYSTEM TECHNOLOGIES
ATOMIC FORCE MICROSCOPES
AFM
ATOMIC FORCE MICROSCOPY
Description File Name MIME Type Size
Abstract   eth-29387-01.pdf application/pdf 227.55KB
Fulltext   eth-29387-02.pdf application/pdf 6.28MB
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E-Collection record created: Sat, 19 Apr 2008, 04:48:21 CET