Dünnschichtanalyse mittels Vorwärtsstreuung bei tiefer Energie

Metadata Label	Value
Author(s):	Kottler, Christian
Publisher:	Unknown
Citation:	Kottler, Christian. Dünnschichtanalyse mittels Vorwärtsstreuung bei tiefer Energie. (2005). http://dx.doi.org/10.3929/ethz-a-005023780
Document Type:	Doctoral and Habilitation Theses
Documents:	Abstract (190.11KB), Fulltext (4.92MB)

Detailed Information

Metadata	Description
Title	Dünnschichtanalyse mittels Vorwärtsstreuung bei tiefer Energie
Author(s)	Kottler, Christian
Publication Place	Zürich
Publication Date	2005
Notes	Diss., Naturwissenschaften ETH Zürich, Nr. 16079, 2005
Language	German
DOI	http://dx.doi.org/10.3929/ethz-a-005023780
Subject(s)	Condensed Matter
Keyword(s)	QUANTITATIVE X-RAY POWDER DIFFRACTOMETRY CRYSTALLOGRAPHY PROPERTIES OF THIN LAYERS PHYSICS OF MOLECULAR SYSTEMS PASSAGE OF IONS THROUGH MATTER ELECTRODYNAMICS

Description	File Name	MIME Type	Size
Abstract	eth-28028-01.pdf	application/pdf	190.11KB
Fulltext	eth-28028-02.pdf	application/pdf	4.92MB

Description	URL
NEBIS Link	http://opac.nebis.ch/F/?local_base=NEBIS&func=find-b&find_code=SYS&request=005023780

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