Model-based control of atomic force microscopes

Metadata Label Value
Author(s): Schitter, Georg
Publisher: Unknown
Citation:

Schitter, Georg. Model-based control of atomic force microscopes. (2004). http://dx.doi.org/10.3929/ethz-a-004726149

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (256.66KB)
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Detailed Information

Metadata Description
Title Model-based control of atomic force microscopes
Author(s) Schitter, Georg
Publication Place Zürich
Publication Date 2004
Notes Diss., Technische Wissenschaften, Eidgenössische Technische Hochschule ETH Zürich, Nr. 15449, 2004
Language English
DOI http://dx.doi.org/10.3929/ethz-a-004726149
Subject(s) Physics, General
Keyword(s) ATOMIC FORCE MICROSCOPES
AFM
ATOMIC FORCE MICROSCOPY
MEASURING DEVICES
SENSORS
DETECTORS
PHYSICS
CONTROL ENGINEERING THEORY
REGULATION ENGINEERING THEORY
ELECTRICAL ENGINEERING
Description File Name MIME Type Size
Abstract   eth-27226-01.pdf application/pdf 256.66KB
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E-Collection record created: Sat, 19 Apr 2008, 02:12:27 CET