Methods to measure and modify electrical properties on a nanometer scale and their applications in science and technology

Metadata Label Value
Author(s): Jacobs, Heinrich Otto Heiko
Publisher: Unknown
Citation:

Jacobs, Heinrich Otto Heiko. Methods to measure and modify electrical properties on a nanometer scale and their applications in science and technology. (1999). http://dx.doi.org/10.3929/ethz-a-002049756

Document Type: Doctoral and Habilitation Theses  
Documents: Abstract (535.16KB)
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Detailed Information

Metadata Description
Title Methods to measure and modify electrical properties on a nanometer scale and their applications in science and technology
Author(s) Jacobs, Heinrich Otto Heiko
Publication Place Zürich
Publication Date 1999
Notes Diss. Techn. Wiss. ETH Zürich, Nr. 13016, 1999. Ref.: Andreas Stemmer ; Korref.: Werner Bächtold
Language English
DOI http://dx.doi.org/10.3929/ethz-a-002049756
Subject(s) Condensed Matter
Keyword(s) NANOSTRUCTURE
CONDENSED MATTER PHYSICS
ELECTRICAL AND DIELECTRICAL PROPERTIES OF THIN FILMS
PHYSICS OF MOLECULAR SYSTEMS
MEASUREMENT METHODS
TECHNIQUES FOR SURFACES
SCANNING PROBE MICROSCOPES
SPM
SCANNING PROBE MICROSCOPY
Description File Name MIME Type Size
Abstract   eth-22887-01.pdf application/pdf 535.16KB
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E-Collection record created: Fri, 18 Apr 2008, 21:19:10 CET