Near field emission scanning electron microscopy

Metadata Label	Value
Author(s):	Kirk, Taryl Leaton
Publisher:	ETH
Citation:	Kirk, Taryl Leaton. Near field emission scanning electron microscopy. ETH (2010). http://dx.doi.org/10.3929/ethz-a-006032158
Document Type:	Doctoral and Habilitation Theses
Documents:	Abstract (172.39KB)

Detailed Information

Metadata	Description
Title	Near field emission scanning electron microscopy
Author(s)	Kirk, Taryl Leaton
Publication Place	Zürich
Publisher	ETH
Publication Date	2010
Notes	Diss., Eidgenössische Technische Hochschule ETH Zürich, Nr. 18824, 2010
Language	English
DOI	http://dx.doi.org/10.3929/ethz-a-006032158
Keyword(s)	SCANNING ELECTRON MICROSCOPES SEM SCANNING ELECTRON MICROSCOPY FIELD-EMISSION ELECTRON MICROSCOPES FIELD-EMISSION ELECTRON MICROSCOPY MICROSTRUCTURE OF MOLECULAR SYSTEMS PHYSICS

Description	File Name	MIME Type	Size
Abstract	eth-1066-01.pdf	application/pdf	172.39KB

Description	URL
NEBIS Link	http://opac.nebis.ch/F/?local_base=NEBIS&func=find-b&find_code=SYS&request=006032158

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