7 Results for (keywords_en:MEASUREMENT METHODS FOR THIN FILMS)

Subscribe to RSS feed for this result set

1. Schichtadmittanzmessung mit Mikrowellen

Lamoth, Istvan (1987)


2. Attenuated total reflection spectroscopy: linear and non-linear optical properties of polymeric materials

Ahumada, Oscar (1998)


Doctoral and Habilitation Theses

3. Methods to measure and modify electrical properties on a nanometer scale and their applications in science and technology

Jacobs, Heinrich Otto Heiko (1999)


Doctoral and Habilitation Theses

4. Brillouin-spectroscopy on thin films and intermediate valent rare earth compounds

Schärer, Urs (1997)


Doctoral and Habilitation Theses

5. Transmission electron microscopy of Fe-Si and Si film on Si substrates

Deller, Hans Rudolf (1997)


Doctoral and Habilitation Theses

6. Eigenschaften anodischer Oxidschichten auf Titan

Müller, Yves (2002)


Doctoral and Habilitation Theses

7. Electron interferometry

Egger, Stefan (2000)


Doctoral and Habilitation Theses